XGL-MCSH-3100:
Multi-channel analyzer with shaping amplifier.

A complete Multi-Channel Analyzer equipped with a shaping amplifier and a USB interface to PC, optimized for Silicon Drift Detectors (SDDs).

XGL-MCSH-3100 performances:

• It allows best spectroscopic performances.
• Maximum measured through put:
  0.9 Mcps @ 150ns shaping time
  3 Mcps @ 50ns shaping time
• Shaping Amplifier: 5^th order semi-gaussian
• Two shaping time selection:
  1μ (for spectroscopy requiring high energy resolution), 250ns (for spectroscopy at high count rate).
  The shaping time is customable on request from 100ns to 10μs.
  Gain regulation. Pole-zero compensation. Built-in Base Line Restorer and Pile Up Rejector.
  Record spectroscopic performances have been obtained with this unit feed by the XGL-CPA-2100.
• USB 2.0 interface
• User Interface and control software on Windows OS.
• Libraries available for easy interface.
• ADC: Resolution: 14bit, Max conversion rate:
  10MSPS, Integral Nonlinearity Error: 2.5 LSB, Differential Nonlinearity Error: 0.6 LSB
• FPGA - XILINX SPARTAN-3E: 500k system gates, 48MHz.

About XGLab:

XGLab offers its customers complete radiation detector systems equipped with Silicon Drift Detectors.
XGLab also offers highly customized design work of these complete detectors and measurement systems (comprised of a SDD detector, the related front-end electronics, and the software), suitable for scientific, biomedical, industrial and civil applications.